Used FEI Quanta 200 FEG #293601213 for sale
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ID: 293601213
Field Emission Gun Scanning Electron Microscope (FEG-SEM)
OXFORD 6650-M EDS Detector
HASKRIS Chiller
ALCATEL / ADIXEN / PFEIFFER NRC15 Vacuum pump
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT IDP 15 Dry scroll pump.
FEI Quanta 200 FEG is a type of scanning electron microscope (SEM), designed for imaging surface features at very high magnifications and using a low beam voltage. It employs a tungsten filament as the source of electron beams, which are scanned in a raster pattern across the surface of the sample. The primary feature of this SEM is its field emission gun (FEG). The FEG is composed of a cold conductive cathode, typically made of tungsten, with multiple fine interconnected tips that are closely spaced. This FEG is capable of generating an extremely bright and highly focused electron beam, which has a much higher resolution than more conventional thermal electron sources. Quanta 200 FEG has two sections which can be operated independently; the lowload module and the highvoltage module. The low load module is used for large or low resolution samples, while the high voltage module is used for higher resolution samples including specimens of high contrast materials. Furthermore, this SEM has a unique vacuum system which maintains the sample chamber environment stable during long term observation for periods of several hours or days. The field emission gun provides excellent flow resolution, made possible by the ability to operate with lower accelerating voltage than conventional thermal electron guns. This allows for dynamic imaging and provides a three-dimensional view of the specimen. Automated features such as auto-contour and auto-dwell time allow efficient imaging of high-contrast samples. FEI Quanta 200 FEG also has a wide range of analytical capabilities such as energy dispersive spectroscopy (EDS), spectral imaging, and electron backscatter diffraction (EBSD). In addition to its advanced imaging capabilities, Quanta 200 FEG offers the user the ability to control specimen movement and manage multiple specimens within the same sample chamber. This allows a wide range of specimen preparation, such as thin film growth, sputter coating, and ion beam polishing. The user can also take advantage of the advanced automation tools, such as environmental control and sample manipulation stages, which enable higher throughput and ease of use. Overall, FEI Quanta 200 FEG is an advanced scanning electron microscope that provides high resolution imaging and excellent analytical capability. It is particularly well suited for applications such as failure analysis, thin film analysis, and nanoscale research. Additionally, its unique vacuum system and automated features enable highly efficient specimen preparation, imaging, and analysis.
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