Used FEI Strata FIB 205 #9233566 for sale

FEI Strata FIB 205 is a high-end scanning electron microscope (SEM) designed for researchers and scientists who require advanced imaging and mapping capabilities. The equipment offers a multitude of useful features to ensure the highest resolution imaging and analysis possible. Strata FIB 205 is based on a Field Emission Gun (FEG) and a custom designed Quattro specimen stage that are specifically designed for DualBeam workflows. The advanced optics, nanostage, superior sample illumination, and a multitude of accessories make the system a powerful tool for imaging and data collection. The Quattro stage is capable of carrying a sample up to 9mm in thickness and is particularly well-suited for imaging of 3D nanostructure. FEI Strata FIB 205 boasts a high brightness FEG that provides exceptional resolution and high beam current density resulting in improved imaging speed. This unit also features a large 6.3" field of view that is capable of imaging large sample sizes with improved depth of focus. Strata FIB 205 also includes a variety of sample holders and stages, such as the Correlative Mapping Stage, which is capable of automatically correlating data from secondary electron and backscattered electron detectors. The SuperDry sample holder enhances imaging quality for hydrophilic samples, while the CrystalView sample holder is designed for imaging structured surfaces in real-time. FEI Strata FIB 205 is IntelliTune enabled for automated detection depending on the task, as well as easy-to-use automated mapping software and automated image processing for improved results. The machine also includes advanced image acquisition tools that are capable of capturing ultrahigh-resolution data or perform larger-scale surface measurements. Strata FIB 205 provides state-of-the-art scanning electron microscope performance for research and development applications. With advanced imaging and mapping capabilities, excellent sample preparation and automated tools, FEI Strata FIB 205 is one of the most powerful scanning electron microscope systems available.