Used FEI / TECNAI F20 X-TWIN #9151726 for sale

FEI / TECNAI F20 X-TWIN is a scanning electron microscope used for high resolution imaging and analysis. It has a factor of 0.25nm (nanometer) lateral and 0.065nm (nanometer) depth resolution. This sophisticated electron microscope combines SCHOTTKY Field Emission (FE) and field emission transfers (FET) technologies to provide enhanced resolution and image contrast. FEI F20 X-TWIN consists of a microscope column containing a pair of high-voltage power supplies and a magnetic field wing to support the electron optics. It is also equipped with a sample stage that is specially designed to move the sample surface in all directions and at variable speeds for highly accurate and precise imaging. TECNAI F20 X-TWIN offers advanced imaging capabilities such as X-ray and electron tomography, in addition to conventional SEM applications. It also allows users to image non-conductive materials and specimens that otherwise could not be examined in SEM using the FET technology. It features a high-definition CCD electron detector and an integrated charge-reduction Vacuum Stabilization system to effectively reduce charging artifacts. An important aspect of this electron microscope is its EvolutionTM Microscope Control system, which provides a user-friendly environment and comprehensive imaging capabilities for multiple applications. It has provisions for additional accessories for more advanced analysis such as energy-dispersive X-ray spectrometry (EDS), energy-filtering (EFS) and backscattered electron imaging (BSEI). Additionally, its motorized liquid-nitrogen-cooled silicon-drift detector (SDD) offers a wide range of elemental analysis capabilities. This feature is especially useful for materials such as those used in semiconductor industry that requires exact measurements of element ratios and amounts. Overall, F20 X-TWIN is a highly specialized scanning electron microscope used for high-resolution imaging and analysis. It offers excellent resolution and image contrast due to its SCHOTTKY field emission and field emission transfer technologies. Its EvolutionTM Microscope Control system enables easy operation and offers powerful imaging capabilities along with a variety of accessories for more advanced analysis requirements. FEI / TECNAI F20 X-TWIN is thus one of the best in its class for advanced materials and semiconductor application.