Used FEI TECNAI G2 F20 X-TWIN #293620685 for sale
URL successfully copied!
Tap to zoom
ID: 293620685
Vintage: 2006
Transmission Electron Microscope (TEM).
EDAX
HAADF Detector
2006 vintage.
FEI TECNAI G2 F20 X-TWIN is a state-of-the-art scanning electron microscope (SEM). This powerful device is designed to generate high-resolution images of microscopic specimens in an incredible variety of applications, such as biological research, industrial inspection, and nanofabrication. The TECNAI G2 offers a resolution of up to 1.7nm, among the best in its class, allowing for precise analysis of minute features. Its 20kV accelerating voltage ensures high-quality imaging and low sample damage, while its patented X-Twin electron optics provide a wide field of view and a high level of image contrast. Additionally, its dual-axis synchronization allows for quick and accurate positioning of the sample with respect to the beam. The TECNAI G2 is also equipped with a variety of user-friendly features including easy-to-navigate software, precise automation for specimen manipulation, and intuitive operation for both routine imaging and sophisticated research techniques. Its broad range of accessories further enhances the system's versatility, allowing for multiple specimen holders for large samples and cryogenic and environmental chambers that enable imaging of specimens under different pressure and temperature conditions. TECNAI G2 F20 X-TWIN is a versatile, compact, and reliable workspace solution. Combining performance, ease of use, ergonomics and safety, this microscope is an ideal choice for advanced microscopic research and industrial applications. Thanks to its exceptional optics, high resolution and low sample damage, the TECNAI G2 is perfect for any research or inspection project.
There are no reviews yet