Used FEI Tecnai G2 F20 #293618175 for sale

FEI Tecnai G2 F20 is a versatile scanning electron microscope (SEM) designed for use in a variety of research and industrial applications. It uses focused beams of electrons to achieve high resolution imaging of surfaces or cross-sections of bulk materials. This SEM is equipped with a cold field emission gun (FEG) electron source that offers excellent image resolution and superior performance in challenging applications. It is capable of imaging samples up to a maximum area of 6.5 cm x 6.5 cm with a maximum magnification of 300,000X. In addition, Tecnai G2 F20 has an integrated gas-injection sample stage system (GIS), enabling the user to perform gaseous or vacuum chamber SEM operations with precision. The sample-handling features of FEI Tecnai G2 F20 allow for automated, non-contact sample loading and optimized vibration control. It has a large sample chamber and can easily be combined with additional sample holders for custom analysis. The enclosed chamber eliminates ambient contamination and also enables collection of secondary electrons for surface spectroscopy. In terms of imaging and analysis capabilities, Tecnai G2 F20 can collect high-resolution backscattered electron (BSE) and SE2 (secondary electron) images. It has variable scan speed, image sizes, and current range to meet a variety of sample requirements. Using several pre-defined contrast techniques such as variable pressure BSE, monochromatic imaging and edge enhancement, the user can enhance contrast and visibility in different image types. FEI Tecnai G2 F20 has a wide range of analytical capabilities. Its EDS system is powered by an Oxford Instruments X-MAX 80 detector and easily integrates into the SEM environment. It enables elemental analysis with excellent speed, sensitivity, and resolution, and the user can perform image correlation to locate features of interest. Tecnai G2 F20 is an advanced SEM ideal for research and industrial applications that demand superior imaging and analytical performance. It is highly versatile and can handle a wide range of samples, allowing for detailed analysis, visualization, and characterization.