Used FEI Tecnai G2 F20 #9205902 for sale
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ID: 9205902
Transmission electron microscope (S/TEM)
Twin LaB6: 200 kV With tomography
Cryostage and elemental mapping (EELS, GIF)
Equipped with:
GATAN 894
Ultrascan 1000 camera (Pixel size: 14 x 14 µm)
GATAN 914 High tilt tomography cryo-holder
GATAN 863 Tridiem imaging filter (GIF)
Maximum resolution: 0.27 nm.
FEI Tecnai G2 F20 is a scanning electron microscope (SEM) that offers high resolution imaging capability and precision manipulations for researchers across a wide range of scientific disciplines. Tecnai G2 F20 is capable of bringing out the smallest details in samples with a resolution of 1 nanometer. Its large field of view allows scientists to observe larger areas of samples, while the rapid image acquisition system keeps the imaging process speedy and efficient. The instrument features a range of advanced imaging techniques, including secondary electron (SE) and backscattered electron (BSE) imaging, as well as color SE and bright field imaging. The instrument is also equipped with several spectroscopy modes, such as X-Ray Energy Dispersive Spectroscopy (EDS) and Wavelength Dispersive Spectroscopy (WDS), which provide vital information about a sample's elemental composition. In addition to its high-resolution imaging and spectroscopic capabilities, FEI Tecnai G2 F20 also offers precise analytical capabilities thanks to its fully automated stage and navigation system. The stage comprises an ergonomically designed touchscreen and large stage movement area, which enables researchers to easily locate and scrutinize any sample of choice. The automatic tilt compensation system ensures that the sample plane remains perfectly level, while the built-in objective lenses allow the user to achieve higher magnifications for their observations. Other notable features of Tecnai G2 F20 include its Scanning Transmission Electron Microscopy (STEM) capabilities, which allow researchers to use electrons to probe the atom-scale structure of a material. The instrument also features a high voltage range of up to 200kV, which is ideal for imaging heavy elements and large particles. Finally, FEI Tecnai G2 F20 is designed with a large chamber, which allows for rapid venting during sample loading, facilitating fast sample transfers and improved user efficiency. In short, Tecnai G2 F20 is an advanced scanning electron microscope that is highly versatile and capable of delivering a wide range of imaging and spectroscopy capabilities, along with precise analytical capabilities thanks to its automated stage and navigation systems. The instrument is ideal for researchers who require the utmost resolution and manipulation accuracy in their sample examination.
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