Used FEI Tecnai G2 F20 #9246534 for sale

FEI Tecnai G2 F20 is a high-resolution scanning electron microscope (SEM) designed for research applications. Built with a field emission gun, the microscope has the capability of delivering high-resolution, high-contrast images with the use of energy filtering. This allows the user to accurately map elemental distribution and identify subtle features and defect structures. The advanced detection system is able to reach resolutions up to 1.2nm in all directions and a working distance of 14mm for larger specimens. The microscope is capable of variable pressure operation and can achieve pressures ranging from 10-500 Pa, allowing for imaging of samples in a vacuum and at moderate pressure. The variable pressure capability allows for greater flexibility in imaging, enabling the user to acquire a variety of sample types and atomically resolved images. Tecnai G2 F20 is equipped with a robust accelerating voltage, ranging from 0.1-30kV. With the high accelerating voltage comes the ability for the user to adjust the working distance, allowing for imaging of delicate samples and thick samples. This capability also provides improved depth of field information, enabling topographic imaging and 3-dimensional imaging capabilities. The G2 F20 comes with an extensive variety of detectors, providing the user with different methods to collect and analyze the acquired images. With the use of secondary electron detectors such as Everhart-Thornley and Bessel, convergent electron detectors, and backscattered electron detectors, the user is able to obtain images, chemical analysis, crystallographic analysis, and topographic imaging. The addition of the optional Oxford AZtec EDS detector enables users to complement their imaging with elemental mapping and analysis. FEI Tecnai G2 F20 is designed with a user friendly interface, making the use of the microscope easier for the user. Utilizing automation systems such as EasySem, AutoImage and RealTime, users are able to quickly and efficiently set up the conditions for their sample. Additionally, the microscope is also equipped with a Genève X-Y-Z sample manipulator, providing precise movement and accurate alignment of the sample. Tecnai G2 F20 is an advanced and reliable scanning electron microscope for research applications. With its comprehensive suite of detectors, variable pressure capability and user-friendly interface, FEI Tecnai G2 F20 delivers high resolution, high contrast images and accurate analysis of various sample types.