Used FEI Tecnai G2 F20 #9267279 for sale

FEI Tecnai G2 F20 scanning electron microscope (SEM) is an advanced imaging instrument used for observing various types of objects down to nanometer-scale. It is capable of imaging non-conductive specimens without the need for metal deposition of conductive coatings. The G2 F20 is equipped with an array of technologies and features designed to provide superior imaging and analytical data. Its innovative cold field emission electron source provides a high degree of stability while maximizing visible image resolution. The G2 F20's complete automated acquisition and navigation equipment allows for rapid and accurate specimen movement. The G2 F20 uses a combination of electron focused optics and advanced imaging techniques to provide the perfect balance of speed and resolution to allow for detailed observations of a range of specimen, both biological and non-biological. Its Electron Beam (e-Beam) Lithography system enables the user to create patterns and imaging to atomic resolution. The G2 F20 is also optimized for analytical capabilities, allowing researchers to analyze different types of samples. It includes an EDS (Energy Dispersive Spectroscopy) unit for elemental analyses, an EELS (Electron Energy Loss Spectroscopy) machine for chemical analysis, a WDS (Wavelength Dispersive Spectroscopy) tool for elemental mapping and a TEM (Transmission Electron Microscopy) asset for high resolution imaging of nanomaterials. The G2 F20 has a built-in alignment camera to simplify sample positioning and also features a partial electron beam stigmator which allows the user to fine-tune the beam in order to optimize imaging. The imaging and analysis functions offer a wide range of capabilities to enhance imaging, measurement and analysis on a wide variety of materials and specimens. In addition, the G2 F20 provides a high level of operator safety as well as ease of use. Its intuitive user interface and automated features make it relatively easy to operate, while the built-in safety features provide worry-free operation and installation. The G2 F20 also comes with an integrated vacuum model, which ensures that samples remain free from contamination and allow for optimal imaging results. Overall, Tecnai G2 F20 scanning electron microscope is a state of the art imaging instrument that provides researchers with exceptional imaging capabilities, high resolution imaging, and advanced analysis and navigation features. It is a reliable, versatile and easy to use tool that can be used to explore and analyze various types of samples.