Used FEI / TECNAI G2 F30 S-Twin #9028804 for sale

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ID: 9028804
Scanning / Transmission electron microscope (S/TEM) 0.34 nm point-to-point Resolution Gatan Tridiem 863 CCD 2k x 2k Camera Vacuum: diffusion pump with mechanical RP Gun: Schottky FEG 20 – 300 kV Automatic aperture system Imaging: STEM, HAADF, BF/DF 2k x 2k CCD Spectroscopy: Edax EDS Gatan 863 Tridiem Holography (Bi-Prism, and Gatan Holoworks) Lorentz Tomography (FEI SW and tomography holder) EFTEM EELS Lens control Sample holder: Single tilt compustage High visibility double tilt low background holder Tomography holder 2006 vintage.
A FEI / TECNAI G2 F30 S-Twin Scanning Electron Microscope (SEM) is an advanced instrument designed for high-resolution imaging and analysis of a variety of samples. It incorporates a large field of view and dynamic focusing with a dual chamber system designed to keep sample preparation and instrument operation separate. This advanced microscope also features an energy-dispersive X-ray spectroscopy (EDS) detector that provides elemental analysis of the sample. FEI G2 F30 S-Twin SEM features an electron gun delivering a wavelength of 0.1nm for superior resolution and high magnification imaging. It is designed for operation at higher current and voltage levels for a wide range of applications, including imaging biological specimens, measuring materials microstructure and surface roughness, cellular pathology, and drug delivery research. This instrument also offers excellent stability and resolution due to its Focused Ion-Beam (FIB) technology. TECNAI G2 F30 S-Twin SEM is designed to provide superior performance due to its dual chamber architecture, 4-axis motorized stage, and advanced software features. The SEM uses a combination of advanced electronics and optics for high-resolution imaging with detailed contrast and depth. It is also equipped with a sciatic lens to allow for the observation of specimens from both top and bottom surfaces, as well as an optional low-vacuum mode for imaging delicate sample materials. In addition to standard imaging tasks, G2 F30 S-Twin is capable of a range of analytical capabilities including Energy Dispersive Spectroscopy (EDS) Detector, Automated Particle Analysis (APA),Backscattered Electron (BSE) imaging, and Scanning Ion microprobe (SIM). Moreover, its beam current autofocus system and automated optimization allow for detailed characterization of sample chemistry and structure. Overall, FEI / TECNAI G2 F30 S-Twin SEM is a powerful and versatile tool designed for high-resolution imaging and analysis of a wide variety of specimens. It offers an unparalleled combination of features and capabilities, including superior resolution, advanced electromechanical design, a high level of automation, and an extensive range of analytical tools.
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