Used FEI / TECNAI G2 F30 S-Twin #9225984 for sale

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ID: 9225984
Scanning Transmission Electron Microscope (STEM) OS: Windows Accessories: Cameras EDX Image filters (2) Holders: single tilt, double tilt Options included: GATAN MSC794 1K CCD (not installed) EDAX detector HAADF STEM detector EELS is not installed 2003 vintage.
FEI / TECNAI G2 F30 S-Twin scanning electron microscope (SEM) is a powerful piece of imaging equipment that provides ultra-high resolution imaging capabilities for a variety of fields including industry, medicine, and scientific research. This tool provides a powerful combination of features not found in other imaging systems to create a unique imaging experience. FEI G2 F30 S-Twin offers a user a customizable scanning electron beam, a 30 kV high accelerating voltage, and a scanning beam current of up to 2 nA. This electron beam provides a powerful, high resolution field of view and can be used to create high quality elemental maps, images, and analysis of specimen material. A motorized sample holder provides easy specimen loading and precise positioning, with up to 100 µm range of motion and a maximum sample size of 100 mm. TECNAI G2 F30 S-Twin is also equipped with a variety of analytical tools to analyze the elemental composition of samples, including energy dispersive X-ray spectrometry (EDS) and energy-filtering imaging (EFI). The inbuilt EDS allows the user to identify the elemental composition of a specimen, and the high-resolution EFI allows for detailed chemical mapping of the sample. In addition, FEI patented G2 Platform technology enables automated acquisition and analysis on both pin- and platform-mounted specimens. This powerful automated equipment allows users to quickly acquire, process, and analyze samples without spending time configuring the microscope. This system is also designed with a range of safety features including a door interlock, a keyed user access unit, and a shock protection mode which ensures the highest possible level of safety for the instrument. Overall, G2 F30 S-Twin scanning electron microscope provides a powerful suite of imaging, analysis, and automation features that makes it an ideal instrument for a wide range of applications. Its proprietary platform technology and automated Acquisition/Analysis machine make it easy to quickly acquire, process, analyze, and store data for a variety of samples. Its high-resolution imaging capabilities and in-built analysis tools provide the perfect blend of capabilities for any imaging task.
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