Used FEI Tecnai G2 F30 #9199627 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
![FEI Tecnai G2 F30 Photo Used FEI Tecnai G2 F30 For Sale](https://cdn.caeonline.com/images/fei_tecnai-g2-f30_865560.jpg)
![Loading](/img/loader.gif)
Sold
ID: 9199627
Wafer Size: 12"
Vintage: 2005
FE Transmission electron microscope (TEM), 12"
Missing part
2005 vintage.
FEI Tecnai G2 F30 Scanning Electron Microscope is a powerful, high resolution instrument for imaging nano-sized particles and structures, capable of producing images with up to 30 nm resolution. This tool is optimized for imaging of inorganic and nano-sized materials, such as metals alloys, semiconductors, and ceramics. Tecnai G2 F30 is equipped with a field emission gun (FEG) electron source, which improves the stability, quality, and resolution of the images. This electron source also improves the throughput for faster specimen analysis, leading to a higher degree of accuracy and consistency in results. FEI Tecnai G2 F30 Scanning Electron Microscope incorporates a bright and high-resolution electron column that is ideal for high-CONTANGO-sensitive samples, efficient analytical work, and 3D imaging. The microscope's operational efficiency is further enhanced with the inclusion of Smart APE technology, which automatically optimizes the electron beam energy and brightness for the specimen being imaged. In addition to imaging capabilities, Tecnai G2 F30 also features advanced analytical methods such as energy dispersive X-ray spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), Scanning Electron Microscopy-energy Dispersive Spectroscopy (SEM-EDS), and elemental mapping. These analytical methods provide a more accurate and detailed look at specimens, allowing for a deeper understanding of their composition, structure, and properties. The system includes a variety of accessories, such as an automated stage, sample holders and mounts, apertures for precise light measurement, illumination techniques for specimen alignment, and a variety of Everhart-Thornley detectors for detection of low- and high-energy ions. FEI Tecnai G2 F30 Scanning Electron Microscope is ideally suited for research, industrial, and educational applications. Its precision engineering, sophisticated electronics, and high-resolution imaging capabilities make it an invaluable tool for any user seeking detailed information on a range of materials, from metal alloys to semiconductors.
There are no reviews yet