Used FEI TEMLink 14771-003 #9298772 for sale

FEI TEMLink 14771-003 is a scanning electron microscope (SEM) designed for high-resolution imaging, analysis, and automation applications. It is a cost-effective solution for research-grade electron microscopes with a wide range of features and advanced performance. TEMLink 14771-003 is equipped with an in-lens Field Emission Source (FES) that has a high duty cycle and peak brightness of 100 nanoAmps/cm2. This technology allows for very high resolution in imaging and automated analysis. In addition, FEI TEMLink 14771-003 is equipped with an integrated surface analysis equipment (SAXFPE) for elemental analysis and chemical detection. This system is equipped with an AE detector, EDX detector, hyperspectral imaging unit, and a STEM detector to ensure maximum data accuracy. The design of TEMLink 14771-003 also includes its high resolution features. With a long working distance (35 microns) and a high numerical aperture (1.2), FEI TEMLink 14771-003 can image and analyze samples at resolutions up to 4 nm. TEMLink 14771-003 also features software control of its components, allowing for remote operation and automation of its systems. FEI TEMLink 14771-003 also comes with a variety of image processing features as well as automated machine analysis programs. These programs include a statistical analysis tool and an artificial intelligence (AI) driven object classification tool. Automation of tool settings can be used to set predetermined imaging parameters and calibrations for reliable measurements. Finally, TEMLink 14771-003 also includes environmental control options for keeping the microscope stable and safe during long-term and short-term experimentation. This includes features such as a controlled atmosphere and humidity chamber, pressure and vibration control, and a vacuum asset. Overall, FEI TEMLink 14771-003 is a high-performance scanning electron microscope suitable for research-grade imaging and analysis. It has a variety of features that make it a suitable tool for high-resolution imaging, surface analysis, automation, and environmental control. Its in-lens Field Emission Source (FES) and software automation features allow for high-resolution imaging and automated analysis in a cost-effective solution.