Used FEI TEMLink 150 #293604494 for sale

FEI TEMLink 150 is a scanning electron microscope (SEM) designed for nondestructive sample characterization in materials sciences. It is capable of back-scattered electron imaging (BEI) and secondary electron imaging (SEI) at a high resolution and is widely used in high resolution surface contamination analysis. TEMLink 150 operates through the use of a thermionic source which enables the microscope to perform various imaging techniques. It is equipped with a single mode gun containing an electron source (tungsten filament) which is operated at room temperature. This electron source is designed to help reduce maintenance requirements and provide the user with excellent performance. The microscope offers an auto-zero mechanism for fast, accurate and reproducible results. FEI TEMLink 150 is a versatile instrument that can be used to characterize a variety of materials, such as metals, semiconductors, and ceramics. Its flexibility also makes it suitable for imaging of organic materials, such as polymers and biological samples. TEMLink 150 employs a high-resolution imaging detector providing users with a wide range of options. Phase contrast imaging and energy dispersive X-ray spectroscopy (EDS) are among the built-in options. Through the use of an optional digital quantification image processor, users can also obtain quantitative information about specimen features, such as roughness or other surface styles. FEI TEMLink 150 offers excellent imaging and analysis capabilities at a rapid scanning speed. With an adjustable tilt angle, users can easily explore specimen features from multiple angles. The specimen can also be rotated around its vertical axis for complex imaging. In addition, the microscope's automated beam scanning alignment feature enables users to quickly measure, image and analyze specimens. TEMLink 150 also features a modern design, with a tiltable color graphic user interface and easy-to-use graphical tools. And its auto-balance mode eliminates the need for manual adjustment of the microscope's settings, allowing users to rapidly access their desired data and analysis. FEI TEMLink 150, with its excellent performance and advantageous features, is an ideal choice for nondestructive materials characterization. It is an invaluable tool for researchers, engineers and scientists alike.