Used FEI Titan CT #293595104 for sale

FEI Titan CT is a scanning electron microscope (SEM) used for imaging and analyzing the surface structure of solid materials. It has various field of view options for detailed analysis of samples at small and large scale. Titan CT is equipped with a Cold Field-Emission Source (CFES), which produces an increased electron probe current that results in better resolution of features on the sample. Additionally, the CFES reduces charging of particles typically associated with conventional SEMs. With its upgraded computer processing capability, FEI Titan CT can acquire multi-modal image data at unprecedented speeds. This allows for extensive microstructural characterization of samples. Titan CT utilizes a suite of detectors to acquire signals from the sample. Backscattered Electron (BSE) detectors can detect the secondary electrons emitted when the primary electrons strike sample atoms. These provide topographical details of specimens, with both shallow and deep depth of focus. The Secondary Electron (SE) detectors can detect the electrons emitted when the primary electrons interact with the sample surface, providing more topographical details to produce higher contrast SEM images. There are also Parallel Detectors available for analyzing the energy spectrum of emitted electrons. FEI Titan CT can also include an Energy Dispersive X-Ray Spectrometry (EDS) detector for chemical analysis of the sample. This technique allows for the differentiation of elements based on the energy released when they are struck with primary electrons. Further, the EDS detector can be used to measure the elemental concentrations of specimens, allowing for better understanding of their chemistry. Titan CT also provides a powerful aberration-corrected image resolution, generating highly detailed images with up to a 1nm resolution. This allows for the observation of fine features, such as grain boundaries, voids, and cracks. FEI Titan CT can also generate Digital Image Correlation (DIC) to determine all relevant parameters needed to describe the surface of a specimen. The DIC technique is used to obtain both the shape and strain information of the sample. Finally, Titan CT features automated vacuum processes, which reduce beam spot life of the electron source and ensure defect-free operation for extended periods of time. FEI Titan CT also offers a variety of automated, user-friendly functions for specimen preparation. In conclusion, Titan CT is a complex and powerful tool for imaging and analyzing samples of various sizes. Its advanced ergonomics and features make it a preferred choice for microscopy professionals.