Used GSM ST 60N-B4 #9394812 for sale

GSM ST 60N-B4 is a high performance scanning electron microscope (SEM) that has been designed for a diverse range of material applications. It is a stand-alone equipment which includes a vacuum chamber, electron gun, source, and detector. The electron gun is based on a field emission source, which is capable of delivering high-resolution images with low lateral and depth spread. It also includes an advanced electron indicator system which helps to accurately adjust the focus of the electron beam. ST 60N-B4 is equipped with a standard 50 mm objective lens capable of providing a resolution of 1.0 nm. It also comes with an optional 120 mm objective lens which increases the resolution to 0.117 nm. The detector unit is comprised of two sets of detectors. The backscatter detector is used to detect secondary electrons generated by electrons interacting with the sample which escapes in a backward direction. While the secondary electron detector is used to detect secondary electrons which emerge from the sample in a forward direction. The machine also includes a built-in low voltage control tool which enables optimal performance with different samples. GSM ST 60N-B4 is designed with a vacuum chamber capable of reaching a pressure of 0.1 Pa. It also comes with a programmable power supply, which is used to supply a constant and stable current to the electron gun. Finally, ST 60N-B4 comes with a dedicated control software package, which allows for a powerful user interface and adjustable parameters. It makes it easy for a scientist to configure and customize different SEM scanning modes. This makes it an invaluable tool for performing structural and microstructural analysis of materials.