Used HITACHI 4600 #9244798 for sale

HITACHI 4600
ID: 9244798
Defect review Scanning Electron Microscope (SEM).
HITACHI 4600 scanning electron microscope (SEM) is a powerful imaging and analytical tool that allows for exploration of the topographical and structural features of a wide variety of materials. The instrument provides detailed imaging and microanalysis capabilities, such as elemental mapping and line scans. The high-resolution digital imaging capabilities of 4600 SEM facilitate observation of imaging samples of almost any conductive material, including metals, polymers, and composites. It features a high resolution field emission gun (FEG) satisfying the demand for detailed images, even on sub- micron structures. The gun has a low current density that helps to minimize damage to the sample while still providing resolutions less than 1 nm. The automated operation and user-friendly software of HITACHI 4600 SEM make it an ideal instrument for a wide range of materials characterization applications. Through automated stigmator controls, the analysis of samples has become greatly simplified over manual operations. The AutoScan system controls sample focusing, stigmation, brightness, contrast, and other factors without the need for manual input. The SEM includes an integrated EDS X-ray detector system for elemental analysis. The versatile X-ray system allows for the acquisition of data in a wide variety of modes including single-element mapping, full-spectrum EDX analysis, and isolated peak measurements. Energy Dispersive Spectroscopy (EDS) can provide both qualitative and quantitative information about the sample material. 4600 SEM is an important tool for materials science research including metallurgy, electronics, and environmental engineering. It also plays a major role in the semiconductor industry through the inspection and testing of integrated circuits, and in the automotive and aerospace industries for failure analysis and quality control. With its advanced imaging and analytical capabilities, HITACHI 4600 SEM gives researchers the insight required to better understand the structure and composition of materials.
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