Used HITACHI 7000 #9005737 for sale

HITACHI 70000 scanning electron microscope (SEM) is an advanced state-of-the-art microscope system used to analyze a range of features at the nanometer scale. It features a significantly higher resolution and an advanced chamber design that enables sub-nanometer level atomic structure analysis. HITACHI 70000 utilizes a highly advanced SEM column with a unique design that is designed to achieve the highest resolutions from any microscope on the market. This column features a specialized energy filter that is capable of transmitting both high-energy and low-energy electrons while maintaining stability and providing optimum image clarity. The electron detector array also helps to provide the highest quality images, as it is able to collect a wide range of electron signals from regions of interest with minimal backscatter. The system also features a series of advanced technologies including a new type of energy filter technique, auto-focus, and image simulation. The auto-focus utilizes an advanced algorithm to optimize focus in highly detailed images, as well as allowing for acquisition of ultra-high resolution images without the need for image-stabilization techniques. The image simulation allows users to create 3D models of an object based on the acquired image being studied. HITACHI 70000 also features a variety of methods to retain the highest quality images produced by the microscope. The user can choose from different techniques such as high frame rate, freeze-fracture, and low-dwell time. Apart from producing images of the highest quality, the use of these methods allow for an increase in the speed of the images being acquired. In a nutshell, HITACHI 70000 is the top of the line scanning electron microscope on the market today. Highly sophisticated components enable users to produce the most detailed images available, while the advanced features provide invaluable analysis capabilities. With its unique design and advanced technologies, HITACHI 70000 is a must-have tool for the imaging of nanometer-level structures.