Used HITACHI 8820 / 7800 #293794159 for sale

HITACHI 8820 / 7800 is a versatile scanning electron microscope (SEM) manufactured by HITACHI High-Tech Corporation, a leading provider of scientific instruments and advanced technologies. This powerful instrument offers researchers and scientists the ability to examine samples at high magnifications and with exceptional imaging resolution, making it a valuable tool for a wide range of applications in materials science, biology, geology, and other fields. At the heart of 8820 / 7800 is its advanced electron optics system, which includes a high-brightness electron source, electromagnetic lenses, and precision beam control mechanisms. This system enables the microscope to generate a focused electron beam that scans across the surface of a sample, interacting with the atoms in the material and producing signals that are used to create detailed images of the sample's topography, morphology, and composition. One of the key features of HITACHI 8820 / 7800 is its high-resolution imaging capabilities. With a maximum resolution of up to 0.4 nanometers (nm) at 30 kiloelectron volts (keV), this SEM is capable of producing images with exceptional clarity and detail, allowing researchers to observe nano-scale features and structures in their samples. In addition, the microscope offers a wide range of magnification options, from as low as 5x to as high as 300,000x, giving users the flexibility to analyze samples at various scales. 8820 / 7800 is equipped with a range of detectors that allow users to capture different types of signals generated by the electron beam-sample interaction. These detectors include secondary electron detectors for imaging surface topography, backscattered electron detectors for elemental contrast imaging, and energy-dispersive X-ray detectors for elemental analysis. This multi-modal imaging capability enables researchers to gather comprehensive information about the composition and properties of their samples. In addition to its imaging capabilities, HITACHI 8820 / 7800 also offers advanced analytical functionalities that facilitate in-depth characterization of samples. The microscope is capable of performing elemental analysis through energy-dispersive X-ray spectroscopy (EDS), which enables researchers to identify and quantify the elements present in a sample based on the characteristic X-ray signals emitted during electron beam bombardment. Furthermore, the microscope can be equipped with electron backscatter diffraction (EBSD) detectors for crystallographic analysis, allowing users to study the microstructure and orientation of crystalline materials. 8820 / 7800 is designed with user-friendly software interfaces and intuitive controls to streamline operation and data analysis. The microscope's software allows users to adjust imaging parameters, navigate the sample stage, and acquire and process images with ease. Furthermore, the instrument is compatible with various data processing and visualization tools, enabling users to analyze and share their results effectively. Overall, HITACHI 8820 / 7800 is a sophisticated scanning electron microscope that offers exceptional imaging resolution, analytical capabilities, and user-friendly features. With its versatility and high-performance specifications, this instrument is well-suited for a wide range of scientific and research applications, providing valuable insights into the microstructure, composition, and properties of diverse materials and samples.