Used HITACHI CG 4000 #293758112 for sale

HITACHI CG 4000
ID: 293758112
Critical Dimension Scanning Electron Microscopes (CD-SEM).
HITACHI CG 4000 is a Scanning Electron Microscope (SEM) with a ubiquitous presence in the modern research laboratory. This versatile instrument offers powerful and comprehensive capabilities for examining the surface of a wide variety of samples, from minerals and crystallites to large containing specimens such as drug tablets and nano-devices. HITACHI CG4000 features a number of advanced technologies to maximize performance and efficiency, including an ultra-high resolution field emission gun (FEG) for a stable source of high-intensity electron beams, an ultimate objective lens for delicately manipulating and imaging samples larger than the resolution of the SEM, and a 100-element detector array for fast and detailed imaging of the sample. The FEG in CG-4000 is capable of emitting electrons at a wide range of angles for superior contrast imaging and surface imaging. The ultimate objective lens configuration ensures the highest possible resolution for each type of sample, and can accurately focus the FEG-emitted beam to create an electron probe one nanometer in diameter. The 100-element detector array in CG 4000 is segmented to allow for simultaneous large-scale and detailed surface imaging. The built-in fast imaging functionality further boosts CG4000's performance, while its fully-automated scanning and visual magnifying stages contribute to outstanding versatility. HITACHI CG-4000 also features a dedicated high-definition 3CCD camera for optimal visual feedback of the sample, as well as a range of automated and manual stages including eucentric XY, eucentric Z, and tilt stages for precise point-by-point sample investigations. Overall, HITACHI CG 4000 is an incredibly powerful SEM with features and capabilities that can meet even the most ambitious research requirements. Its combination of advanced electron optics, detector array, automated stages, and fast imaging techniques allows for efficient and informative analysis of a wide variety of samples.
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