Used HITACHI CG 4000 #293768309 for sale

HITACHI CG 4000 is a scanning electron microscope (SEM), allowing for the observation of high resolution images of biological and non-biological surfaces. It has an acceleration voltage range of 1 to 30 kV, allowing for a wide range of non-destructive analyses. The beam auto-focusing (AF) system provides highly accurate automatic focusing and the detector assembly supports four modes of operation, including scanning, micro-imaging, large area imaging and low voltage SEI. The entire surface of the sample can be mapped using the scanning function. Meanwhile, the micro-imaging feature provides a very high resolution image of a single region for further analysis. The large area imaging feature scans up to 50 square microns while collecting high resolution images. The low voltage SEI (secondary electron imaging) mode allows for the analysis of planar regions. Additionally, the detector assembly offers both an in-column energy filter for EDS (energy dispersive spectroscopy) analysis and an additional detector can be used to perform EBSD (electron backscatter diffraction) analysis. The data is collected and processed by the Eclipse software. HITACHI CG4000 offers superior performance and has a powerful correction system, which corrects many of the artifacts associated with SEM imaging. It is capable of imaging features down to 0.5nm in size and can detect small features on the sample surface. The microscope also offers an in-column gas flow system that allows users to perform analytical experiments, like tem or trem, at different levels of magnification. In addition, it has a dedicated sample navigator focusing module that automatically follows topographic features to help ensure images remain deterministic and repeatable. Overall, CG-4000 is a powerful and reliable SEM, providing high resolution imaging and analysis capabilities for a variety of applications.