Used HITACHI CG 4000 #9363493 for sale

ID: 9363493
Wafer Size: 12"
Vintage: 2007
Scanning Electron Microscope (SEM), 12" (3) Load Ports Hard Disk Drive (HDD) Options: SECS Accessories Auto beam alignment Multi-point Wafer searcher Edge roughness Shortest width Hole measurement Corner measurement Image database GEM Multi port HSMS Save to DOS FD Fast AFC IP Read Recipe queue AGV Focus map Mag maximum: 500x Auto stigma SPM Electron optics ArF Rectangular scan, 300K CMS STS CJM PJM OM 200X Auto beam alignment on wafer LWE Analysis Flat scan OCC Automation DG Recipe compression Bottom surface masking 2007 vintage.
HITACHI CG 4000 is a scanning electron microscope designed for research in a variety of fields, including materials science, nanotechnology, and biology. It has a scanning electron source to produce electron beams from an acceleration voltage of up to 30kV, with a resolution of 1.3nm. The powerful source allows for a wide range of analysis techniques, such as elemental mapping, topographical analysis, and energy dispersive X-ray spectroscopy. HITACHI CG4000 has a large viewfinder to aid in the manipulation of the sample and to observe changes in the surface. Control of the specimen is provided by a 5-axis stage, allowing for both large-scale and small-scale movement of the sample. This allows for fast rates of sample movement, allowing for faster imaging and higher throughput. The automated, non-contact focus coil has a maximum power of 4 watts, which allows for a faster, more accurate focus adjustment. This helps ensure a clear imaging of the sample, enabling the identification of fine details that may have been previously overlooked. The sample chamber of CG-4000 is completely sealed and has atmosphere circulation, making it suitable for a wide range of sample manipulation and analysis. Including stage temperature control, allowing researchers to manipulate the environment and conditions of the chamber without risking contamination, and gas ion source for precise analysis and scanning. The contoured imaging screen of HITACHI CG-4000 has a spherical protective cover to protect the electron beam detector from damage. The detector has a resolution of 2000 x 2000 pixel resolution, enabling extremely sharp image quality. In addition to capturing images of high resolution, CG4000 also has an integrated video camera to capture videos of the sample. The video feed can be displayed full screen, and pauses or repeating playback can be made to analyze the sample in detail. CG 4000 is an advanced scanning electron microscope ideal for a wide range of applications. Its acceleration voltage and resolution combine for a high level of detail, making it suitable for detailed surface analysis. Its wide range of analysis functions, such as elemental mapping, topographical analysis, and energy dispersive X-ray spectroscopy, makes it suitable for a variety of research tasks. With its automated, non-contact focus coil, stage temperature control, and integrated video camera, HITACHI CG 4000 is an extremely versatile and powerful instrument.
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