Used HITACHI CG 4100 #293603081 for sale

HITACHI CG 4100 scanning electron microscope (SEM) is an invaluable tool for researchers, engineers and product designers. It offers superior images of both macro and micro features in samples, allowing for the detailed investigation of physical and chemical characteristics. Its high resolution and wide operating range make it an excellent choice for nanoscale imaging. HITACHI CG4100 utilizes scanning electron optics to generate images of samples, using the reflection of a beam of electrons to identify their structure. Its motorized digital magnification system is capable of zooming in and out between 20x and 500,000x, enabling observation of specimens at the nanoscale level. Ultra-high resolution secondary electron images can be captured up to 0.8nm and high-contrast images can be generated through backscattered electron imaging (BSE). In addition to its optical capabilities, the technology enables the user to analyze samples with high resolution X-ray elemental analysis. This allows for quantification of elements in samples with a sensitivity of down to 0.5%. The system also provides users with control over the electron beam. The beam can be focused and the current and voltage can be adjusted to achieve the best images for a given application. CG-4100 SEM comes complete with both software and hardware components; it is a reliable and easy to use system, requiring minimal set up time. Its practical design allows users to configure it to their specific needs, helping to optimize image quality and analysis. In summary, CG 4100 SEM offers excellent images of both macro and micro features in samples, combined with a wide operating range and an array of practical features such as digital magnification, X-ray elemental analysis and adjustable electron beams, making it the perfect choice for nanoscale imaging tasks.