Used HITACHI CG-5000 #9350302 for sale
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ID: 9350302
Wafer Size: 12"
Vintage: 2014
Scanning Electron Microscope (SEM), 12"
(3) Ports
Mini-environment transfer system
Type C to C auto-loader
With load lock system
E-Chuck stage system
Display unit
Water circulator with power cable and pipe
XL 10 Optical microscope: 220x
Main power cable (PS): l5 m
Electrified sample correction (SPM)
Auto calibration system using stub pattern
Multi-Point, gap, corner, radius measurement function
Image filing function
Recipe queue
Shield cover for CG5000
Power supply unit:
Ion pump back-up power supply unit
SE-Gun back-up power supply unit
Hardware:
(3) TDK FOUP Openers
RFID Included
BOC EDWARDS iGX100 Dry pump interface
HYNIX Spec signal light tower
Light curtain
X, Y Dual micro-scale
Energy filter
Ionizer
Not included:
HARC Observation function
Pre-dose optics modification
KRF Defect review network 1/F
Power supply: AC 208 V, 60 Hz
2014 vintage.
HITACHI CG-5000 is an advanced Scanning Electron Microscope (SEM) equipment designed for sophisticated imaging and analysis of materials on multiple scales. This versatile tool combines the latest in electron microscopy technology to achieve fast, high-resolution imaging and features a robust array of analytical instruments for a wide spectrum of applications. The SEM system offers a range of imaging and analytical features for different applications, including traditional imaging with secondary electron (SE), backscattered electron (BSE), and electron beam induced current (EBIC) imaging. Furthermore, it is capable of variable vacuum (VV) operations and real-time energy-dispersive spectroscopy (EDS). With a field emission gun (FEG) and a computerized unit for tiling, area scanning, and 3D mapping, HITACHI CG5000 can obtain accurate and reliable data from material samples. For operators, CG 5000 machine provides an intuitive user interface with a proprietary software package for various applications, like automatic operation and image enhancement. This tool also features graphical modules for easy checking of specimen before analysis, as well as data storage and analysis functions. Additionally, the package includes an image manipulation asset for accurate measurement, statistical analysis, and 3D reconstruction capability. The high-performance model is based on a remarkable top-hat scan stage that allows for quick and uniform scanning of the sample. Many samples can be loaded with a single holder to reduce loading time while providing excellent image quality. In addition, the small size of HITACHI CG 5000 makes it very easy to install and maintain in any lab environment. For advanced image and data acquisition, CG-5000 equipment can be equipped with accessories that enable advanced imaging and analysis. These include a scanning transmission electron microscope (STEM) and a digital microscopy camera for time-lapse analysis of sensitive specimens. The advanced system also allows for a range of other analytical techniques, from electron holography to full-field electron tomography. Overall, CG5000 SEM unit is an exceptional tool for imaging and analyzing material samples from multiple scales. With its advanced features, intuitive user interface, and automated functions, HITACHI CG-5000 is an invaluable asset to any lab.
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