Used HITACHI CV-103E #9399999 for sale

HITACHI CV-103E is a high-performance scanning electron microscope renowned for its excellent degree of image resolution and adaptability. Among its distinguishing features are its large field of view, its electronic read-out equipment, and its broad spectrum of imaging modes. Utilizing a variety of independent imaging elements, CV-103E offers multiple imaging systems, such as secondary electron contrast (SEC), backscattered electron imaging (BEI), and multiple beam fluorescence imaging (MFI). SEC imaging, which produces the highest contrast images of samples, is well suited for applications such as compositional analysis, crystalline structures, and thin films. BEI reveals the sample's outermost surface composition, while MFI provides detailed information about chemical composition and light elements. Furthermore, HITACHI CV-103E's sample stage has precisely adjustable XY movement, as well as multiple stages that are designed to hold a variety of sample sizes and shapes. A novel sample navigation system is set up on the stage, and users can move samples freely while receiving feedback from an internal control unit. CV-103E also features an energy-dispersive X-ray spectroscopy (EDS) machine, which collects elemental compositions from specimens for mapping and other measurements. The EDS tool analyzes and displays the data in a graphical format for easy interpretation. The high-performance electron optics at the heart of HITACHI CV-103E are capable of magnifications ranging from 1.7x up to 5,000x. An in-column liquid nitrogen-cooled field emission gun allows for accelerated extraction voltage and reduced thermal aberration, providing highly precise image clarity and resolution. The integrated spread-limiter prevents image distortion, and the microscope also features an astigmatism inspector that ensures precise image distortion and trapezoidal aberration control. Finally, CV-103E's innovative software makes the microscope a powerful tool, enabling users to perform many measurements, analyze data, export results in various formats, and generate reports. Moreover, all the data, images, and graphs, can be quickly and easily shared by connecting to a network. Thus, HITACHI CV-103E scanning electron microscope is an advanced instrument, developed to provide high-resolution images, a wide range of imaging capabilities, precise sample navigation, and advanced analytical tools. It is an essential tool for analytical and scientific research, as well as for industrial and medical applications.