Used HITACHI EC-43MTPS #9399954 for sale

HITACHI EC-43MTPS
ID: 9399954
Scanning Electron Microscope (SEM).
HITACHI EC-43MTPS is a high-performance, high-ease-of-use scanning electron microscope (SEM). This versatile equipment features a fully automated high-resolution imaging mode designed to provide superior image resolution compared to conventional SEMs. With a combination of low accelerating voltage and a strong gun shaping, EC-43MTPS offers semiquantitative mechanical measurements of samples that are difficult to be observed with conventional SEMs. In addition, the system provides ultra-high-speed imaging and dynamical studies, making it a powerful tool for high-level materials and biological observations. The unit offers a high degree of flexibility and comes equipped with a variety of optional functions, including an automated function for film thickness measurement and a bright-field detector. In addition, it is equipped with a microwave generation chamber for X-ray microanalysis. This is an ideal choice for researchers looking to perform a variety of tasks including observation of microparticle characteristics and observation of micrometer-scale samples. The machine's built-in two-stage condenser lens delivers a 0.3 nm resolution and offers advanced feature analysis of samples with small grain sizes, allowing for surface damage analysis and high-resolution images to be gathered. Furthermore, it is also equipped with a backscattered electron detector for SEI (scanning electron imaging) studies and an inclined column for imaging light and thin material layers. HITACHI EC-43MTPS has a range of imaging and measurement capabilities. It can measure such parameters as line width, grain size, component concentration and surface roughness. It can also analyze the spatial relationships and crystal structure of materials, as well as evaluate a wide range of structures such as thin films, macromolecules and thin layers. Additionally, it can also measure and analyze electrical characteristics like resistivity and surface area. The tool also provides a high-quality imaging mode for taking X-ray and SEM images of even the finest surface details. The advanced design of EC-43MTPS is impressive and offers great value to researchers in all fields of science. The asset is both reliable and extremely user-friendly, allowing for quick and easy operation. Furthermore, it provides excellent quality and a wide range of measurement and analysis capabilities that make it a great choice for high-level material and biological research.
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