Used HITACHI FB-2000 FIB / HD-2000 #71521 for sale
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ID: 71521
Vintage: 2001
Scanning Transmission Electron Microscope (STEM)
0.24nm resolution
2 million magnification
20 faster than TEM
Z-contrast transmitted image
Windows based user interface
Small, requires 4x5 meter room
FB-2000 is a focused ion beam tool used for sample preparation
Capable of producing extremely high resolution images of submicron structures
Capable of elemental analysis on submicron features using an x-ray detector that is part of the system
Both tools share inter-compatible sample holders which make transitions the sample from one tool to the other seamless
The STEM needs to be repaired
Low cost roughing pump needs to be replaced
High voltage supply needs to be repaired
Currently installed
2001 vintage.
HITACHI FB-2000 FIB / HD-2000 is a scanning electron microscope (SEM) that combines the imaging capabilities of a SEM with the focused ion beam (FIB) technology. By combining these two technologies, it allows for imaging and processing of nanostructures. With the FIB technology, sample can be milled and prepared for imaging, and then scanned for higher resolution imaging and analysis. The FB-2000 is equipped with a high power field emission gun (FEG) that provides excellent image quality at high magnifications and resolutions. It also features a high precision stage for sample positioning and manipulation. This allows for accurate and repeatable imaging of a wide range of sample sizes and types. The FB-2000 is capable of imaging in low, medium, and high vacuum modes. The HD-2000 is a new feature of the FB-2000 that supports high resolution and fast acquisition of images. It allows for higher magnifications and resolutions of up to 1000x, as well as automated processing and analysis of images. The HD-2000 also supports rapid scanning of fields of view, making it perfect for area specific analysis of samples. In terms of accessories, the FB-2000 is compatible with a wide variety of detectors and detectors systems, including EDX, EELS, SPM, and BSE. It also supports a wide range of automated analysis and processing software, allowing for complex and comprehensive analysis of samples. The FB-2000 / HD-2000 also features an easy to use user interface, making operation easy and intuitive. The unit also includes a comprehensive training manual and support from a dedicated technical team to help ensure that users are getting the most from their unit. Overall, FB-2000 FIB / HD-2000 is an excellent choice for imaging and analysis of nanostructures. With its combined FIB and SEM capabilities, it provides excellent image quality at high resolutions and magnifications. Its wide range of detectors and software programs, as well as its intuitive user interface, make it ideal for use in a variety of applications.
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