Used HITACHI FB-2000 #9083776 for sale

HITACHI FB-2000
ID: 9083776
FIB system.
HITACHI FB-2000 scanning electron microscope (SEM) is a versatile tool for nanoscale imaging and analysis. It is a fully automated, state-of-the art instrument with several advanced features. HITACHI FB 2000 is designed to provide high-resolution images for a wide range of specimens and applications. The SEM features high vacuum capability and a much improved original imaging system with greater magnification range and higher resolution than conventional SEMs. It features a Multi-generator Series (MGS) that produces a wide range of electron beams with superior clarity. FB-2000 has an advanced automatic sample changer and a wet cell for wet sample analysis. Additionally, it has an autoalignment system that helps reduce the time necessary for beam alignment, as well as for the selection of appropriate magnifications. FB 2000 has an electron accelerating voltage of 15kV to 1.0MV, which enables users to image both conductive and nonconductive materials. HITACHI FB-2000 also features an electron impact energy of 0.1eV to 10keV, enabling imaging of a wide range of materials. The fully turbo-pumped chamber ensures the maintenance of vacuum at all times, which eliminates the need for frequent ground pumps. A high-resolution digital XRD system with Linemapping capability is also included in HITACHI FB 2000. This feature allows users to accurately measure sizes, composites and chemical content in their images. An in-column EDX detector provides elemental analysis. The software of FB-2000 is also designed to improve user experience. It is intuitive and user-friendly and allows for various settings and adjustments, such as automatic noise reduction and digital clarity. FB 2000 also boasts a wide variety of accessories such as a low-voltage microscope and various lenses. Overall, HITACHI FB-2000 is one of the best SEMs on the market today with its advanced features and user-friendly design. With its state-of-the-art electronics, imaging capabilities, various electron beam options, intuitive software, and a selection of advanced accessories, this SEM offers ultimate performance for a wide range of sampling needs. It is an excellent tool for high resolution imaging and nanoscale analysis.
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