Used HITACHI FB-2000A #9127945 for sale

HITACHI FB-2000A scanning electron microscope (SEM) is a high-precision instrument designed for imaging and analysis of fine structures. Its advanced imaging technology, integrated software, and user-friendly features make it ideal for a wide range of applications. HITACHI FB 2000A is capable of generating high-resolution images up to a resolution of 0.5 nm line width with low-vacuum and variable pressure operation. Its equipment components include a micro column with a high-sensitivity electron detector, high-power Schottky field emission gun, and a field emission scanning electron microscope. The gun has a fine focus adjustment, which enables a fine focus of the sample. The SEM is equipped with a number of auxiliary imaging systems, such as an energy dispersive X-ray spectrometer (EDS), an environmental SEM, an in-lens detector system, and a gas injection unit. The environmental SEM allows for multidimensional imaging of materials in their native state. The in-lens detector machine detects secondary electrons, enabling imaging and analysis of fine structures and ports for gases to be injected onto the sample, such as those used for elemental analysis. FB-2000 A also incorporates the latest technology in automation, providing a range of applications for sample preparation, imaging, and analysis. Automated systems are equipped with sample loaders, holders, deblurrers, and analysis systems, providing user convenience. In addition, it is fitted with software designed to provide comprehensive analysis with data obtained from SEM images. HITACHI FB-2000 A has a wide range of usability, including materials research and development, medical research, and microfabrication. It also offers excellent stage stability, which ensures accurate reproducibility of sample displacement over long periods of time. Utilizing this instrument's features offers excellent results with extreme accuracy and precision. Overall, FB-2000A is an advanced and user-friendly high-resolution scanning electron microscope, and is perfect for a range of imaging and analysis applications involving fine structures.