Used HITACHI FB-2000A #9353718 for sale

ID: 9353718
Focused Ion Beam (FIB) System.
HITACHI FB-2000A is a scanning electron microscope (SEM) designed with a large depth of field for easy observation of even fine features located deep within specimens. It incorporates a variable pressure reduces vacuum (VPN) system that maintains high-precision imaging even at lower magnifications. Additionally, an aberration-corrected lens makes it ideal for imaging of nanoscale specimens. HITACHI FB 2000A utilizes a high-sensitivity electronic display that can switch from low-noise to higher-noise adjustments, providing greater depth of field and image quality than other SEMs. The high-sensitivity electron detection allows for better imaging over a broad range from near-field to far-field. Moreover, a quick contour correction option allows for quick correction of static electric fields when scanning at low vacuum so that values closer to equilibrium conditions can be assimilated. FB-2000 A's system is equipped with an auto-focussing feature that automatically tracks and adjusts focus using image processing technology. This feature reduces dispersion when adjusting focus and improves the accuracy and reproducibility of the focal position during imaging. HITACHI FB-2000 A includes a new optional ion-gun module capable of sputter coating with a conductive coating, such as gold, or an insulator, such as carbon. This simplifies manipulation and imaging of specimens at low vacuum conditions or in electrically uncharged specimens. Additionally, it is capable of variable pressure imaging that reduces back scattering from sample to reduce surface deterioration. FB-2000A also offers optional software packages designed to provide advanced imaging and analysis. These packages include a 3D imaging and simulation software package, as well as an elemental mapping and analysis package. The 3D imaging and simulation software provides accurate simulation, quantitative 3D surface imaging, and 3D computer-generated image (CGI) rendering. The elemental mapping and analysis software provides analysis of elemental composition by displaying overlaid colors of qualitative maps on top of the image. This dataset can be used to accurately measure the area, perimeter, average, etc. of specific elements in the sample. Compatible with FB 2000A is a VacuLab scanning electron microscopy accessory, allowing for simple connection of external gases and liquids from mass-flow controllers and liquid delivery pumps. This allows for a greater variety of processes, such as adjusting dehydration, altering chemical composition, and controlling gas flow environment. Overall, HITACHI FB-2000A is a powerful and versatile scanning electron microscope that combines its comprehensive features, such as variable pressure imaging, aberration correction, high-sensitivity electronics, and 3D imaging capabilities to provide a superlative imaging performance for even the most demanding applications.
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