Used HITACHI FC100Ⅱ #9217662 for sale

HITACHI FC100Ⅱ is a scanning electron microscope (SEM) that is capable of accurately capturing high resolution images of objects on a nanoscopic scale. This microscope uses a focused beam of electrons to scan and create the image of the sample being observed. It then electronically converts the information into a digital form, which is displayed on an accompanying monitor. The operating range of FC100Ⅱ is 0.7 to 25 kV, allowing users to select their desired conditions for imaging samples. Its device also features a tilt stage with a maximum tilt angle of 15 degrees for viewing samples from various angles. It can be used with multiple detectors such as a secondary electron detector, a backscatter electron detector, an Auger electron detector, and a X-ray detector. These detectors enable different types of imaging including topographical, monochromatic, and compositional imaging. This microscope offers a variety of functions to improve its imaging capability. It utilises an image stabilization system to reduce the impact of specimen drift, and an automated focus control to automatically adjust the focal length of the electron beam for optimal sharpness in imaging. It also offers an adjustable specimen tilting stage, allowing users to tilt the sample by preset angles for improved image clarity. HITACHI FC100Ⅱ is equipped with an array of software to control and select imaging parameters, such as magnification, current density, and scan speed. It also features a "diffractogram" feature that allows users to simultaneously capture multiple images at different beam angles to make composition-sensitive differentiation easier. This device has an intuitive control interface to make it easy for users of all skill levels to operate the microscope. This SEM has a large field-of-view of up to 8.2 mm, enabling it to acquire large-scale images quickly. It also contains a unique image capturing system that enables users to easily acquire detailed, 3D images of objects in a much shorter amount of time than with other models. Overall, FC100Ⅱ is an advanced scanning electron microscope that allows users to capture high resolution images of samples on a nanoscopic scale, utilizing a variety of detectors and software, and featuring an intuitive control interface. It is a great choice for those requiring precision image analysis for their research.