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Scanning Electron Microscopes
HITACHI
Focused Ion Beam (FIB)
#293754408
Used HITACHI Focused Ion Beam (FIB) #293754408 for sale
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Scanning Electron Microscopes
Manufacturer
HITACHI
Model
Focused Ion Beam (FIB)
Equipment Details
Reviews
ID:
293754408
Wafer Size:
8"
Vintage:
2017
8" 2017 vintage.
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