Used HITACHI FS200i II #293605451 for sale

HITACHI FS200i II is a high resolution scanning electron microscope (SEM) designed for a wide variety of applications. It combines the latest technologies in electron optical design, image analysis and specimen preparation to produce clear and detailed images of a wide variety of materials, from metals to polymers. At its core, FS200i II consists of a Multi-mode Detector. This is a powerful tool for collecting electron images of a sample at a resolution of 1.2 nm. The multi-mode detector allows you to switch between three modes: secondary electron imaging, back-scattered electron imaging, and simultaneous imaging. In addition, HITACHI FS200i II utilizes a Cold Field Emission Gun. This allows for the rapid acceleration of electrons. The electrons accelerated with this gun have low energy, resulting in more detailed images, with less sample damage. FS200i II takes advantage of electron optics engineering to form, accelerate and focus the electron beam on to the sample. This is accomplished by utilizing an electrostatic lens system. The inner lenses of this system are positioned at the rear of the system and are used to control and focus the electron gun's beam. The main analytical and imaging capabilities of HITACHI FS200i II include: Scanning Electron Topogaphy, Energy-dispersive X-ray Analysis, X-ray Elemental Mapping, and Secondary Electron Imaging. These methods can be used to analyze and characterize a wide variety of materials. Additionally, FS200i II has advanced specimen preparation techniques: Low-vacuum, High Vacuum, Side-entry Pt/Pd coater, and Low Vacuum Etch Process. With the Low Vacuum technique, a few steps of processing can be done without breaking the vacuum. This allows for easy sample handling and contamination control. To meet the needs of educational institutions, HITACHI FS200i II is available in both classroom and laboratory versions. In the educational version, the microscope allows the user to switch between different lenses to adjust the microscopy intensity and resolution. In conclusion, FS200i II scanning electron microscope offers excellent image clarity, a variety of versatile analytical methods and advanced specimen preparation techniques. It is capable of producing clear, high resolution images in a wide range of materials, making it a versatile and powerful tool for research and education.