Used HITACHI FS300i Type II #9203965 for sale
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ID: 9203965
Scanning Acoustic Tomography (SAT) system
Probe frequency range: 15 / 25 / 50 / 75 / 85 / 140 / 200 MHz
Scan area: 360 x 310 x 80 mm
Scan speed: 1000 mm/s
Image pixels: 8192 x 8192
Scanner resolution: 0.5 um
Through probe: 15 to 75 MHz
Scan mode:
A-Scan
C-Scan
T-Scan
Output data format: TIF, JPG
Index data: Image and note
Operating system: Windows XP
Electrical power: 100V, 15A, 50/60Hz.
HITACHI FS300i Type II is a scanning electron microscope (SEM) designed for use in microanalysis. It is a low-vacuum SEM (LV-SEM) that employs a Cold Field Emission High Brightness Source (FEG-HBS), which provides high resolution imaging capabilities. The SEM is capable of obtaining images in an energy range of 0.5 - 30 kV, and is equipped with a sample stage that supports various sizes and shapes of specimens. The LV-SEM offers the latest technology in imaging performance and automated operations. It utilizes a Hyper Face Mapping Equipment (HFMS) that allows samples to be scanned simultaneously from three directions. This system also allows sample data to be compared, providing the user with highly accurate analysis. The SEM also has an Auto Feature Review (AFR) which automatically identifies features of interest and adjusts the imaging parameters in real-time to maximize image quality. FS300i Type II provides superior resolution and contrast. Its Cold Field Emission High Brightness Source produces a highly focused electron beam which allows for the acquisition of high-resolution images with low noise levels. The electron beam is also maintained at a stable current, which ensures a consistent signal-to-noise ratio. The unit is designed to be both user-friendly and low-maintenance. Its ergonomic design allows for easy and comfortable interaction with the SEM, while its self-calibrating objective lens maintains its performance even after long periods of inactivity. Its built-in air-vacuum machine also ensures a fast and compatible environment for live samples. HITACHI FS300i Type II is equipped with a wide array of software features as well. These features include Automated Batch butting and Unification (ABU), Off-axis Back-scattered Imaging (OBI), and Curve Fitting, all of which enhance its capabilities for use in a range of different applications. It is also compatible with a large selection of detectors and imaging accessories. FS300i Type II is an ideal choice for any research lab requiring a powerful, high resolution SEM. With its high brightness source, automated operations, ergonomic design, and software features, it provides users with an efficient and reliable tool for achieving optimal analytical results.
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