Used HITACHI H-7000 #293594719 for sale

HITACHI H-7000 scanning electron microscope is a high-performance tool for researching and testing materials. It is capable of achieving high resolution images and versatile automated functions, enabling researchers to more accurately measure, observe, and analyze specimens. H-7000 provides an easy-to-use user interface for precise specimen manipulation and manipulation of the electron beam. It is a valuable asset for characterizing structure, morphology, crystalline lattice, physical, and chemical properties of materials. HITACHI H-7000 offers a high magnifying power of 1000x and an array of electron emitters for generating powerful electron beams. It is also equipped with an in-lens retractable detector to achieve a wider range of magnification. The system can be configured with ever-higher levels of sophistication, providing researchers with additional levels of detail. The combination of the high-resolution images and advanced digital control makes H-7000 an ideal choice for microscopy and research. HITACHI H-7000 comes with an electric-magnetic field (EMF) chamber, which requires the use of an electron gun to operate and provides an environment for more precise specimen manipulation. In addition, the system utilizes an innovative automated background correction feature, eliminating the need for manual adjustment during imaging and measuring processes. An automated digital read touch-screen control panel is provided, initiating precision analysis and improving workflow efficiency. To further enhance specimen analysis, H-7000 is equipped with EDX, PED, and LA-ICPMS capabilities. It is also able to conduct physical tests such as stress tests and fatigue-strength characterization. This scanning electron microscope also supports a variety of specialized applications such as nanofabrication, chemical-compositional imaging, and microprobe imaging. The intuitive and comprehensive user interface enhances HITACHI H-7000's user-friendly experience. H-7000 scanning electron microscope is a powerful and comprehensive tool for research and testing. Its high resolution images and comprehensive automation are advantageous for characterizing material specimens. Its electric-magnetic field chamber, automated background correction feature, EDX, PED and LA-ICPMS capabilities all contribute to making it a powerful piece of equipment for many applications.