Used HITACHI H-7100 #293699842 for sale
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ID: 293699842
Vintage: 1993
Transmission Electron Microscope (TEM)
DC Heated with filament
Condenser lens
Condenser aperture
Stigmator
Objective lens
Objective aperture
Field limiting aperture
Image wobbler
Specimen holder
Automatic sample position selector
X, Y, Z Axis tilting
VELETA Side mounted camera
Fluorescens search screen
Oil rotation and oil diffusion vacuum pumps
Pirani and penning vacuum gauge
Air compressor
Water cooling system
Power supply: 25-125 kV
1993 vintage.
HITACHI H-7100 is a scanning electron microscope (SEM) that has been produced by HITACHI. This unit is a highly advanced research and analysis tool that provides users with a wide array of features and capabilities. It is capable of producing highly detailed, three-dimensional images of small objects or features at extremely high resolution, allowing for a more in-depth analysis of samples. H-7100 utilizes a scanning electron beam with an enabling resolution as low as 1.5nm. It can also be used for energy-dispersive X-ray spectroscopy (EDXS), which enables elemental composition identification. The SEM has a specimen chamber that can handle up to five specimens. HITACHI H-7100 also offers several other features such as backscattered electron imaging, secondary electron imaging, and electrical capability optical imaging. H-7100 comes with a user-friendly interface and a high degree of automation which eliminates the need for manual operations. Its automated features include a secondary electron signal detector, gold sputtering along with other automated functions. The user interface of HITACHI H-7100 also provides an easy to use menu with adjustable parameters that can be set and modified to suit the specific needs or sample being analyzed. The unit also offers a range of microscope accessories such as a heating/cooling unit, an accelerator, a wafer probe station, an automated sample changer and an accessory case. All of which help improve the capabilities of the microscope. H-7100 has advanced features, allowing users to scan several different types of samples with a wide range of magnification settings. It also allows for multiple specimen imaging with advanced resolution levels. Additionally, users can adjust the camera angle, perform tilt measurements, and use the interactive image analysis software to analyze the images. HITACHI H-7100 is a suitable solution for many kinds of research and material science applications. It provides high resolutions images with top notch automation and control capabilities which make it ideal for labs and research facilities.
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