Used HITACHI H-7100 #9226016 for sale

ID: 9226016
Transmission Electron Microscope (TEM).
HITACHI H-7100 is a scanning electron microscope (SEM) designed for high-performance imaging applications in the research and industrial markets. This instrument uses a Schottky field emission gun (FEG), which allows for high-resolution imaging up to 60,000x at the specimen stage. Compared to other SEMs on the market, H-7100 offers superior image quality with excellent depth of field and less distortion. HITACHI H-7100 also includes a variable pressure chamber, which allows for variable pressure imaging up to 200 Pa. This chamber prevents sample charging and image artifacts from dehydrating specimens, allowing for better specimen imaging of wet samples. A unique feature of H-7100 is its dual electron beam detector, allowing for both Everhardt-Thornley (ETD) or secondary electron imaging. The ETD mode provides elemental chemical identification by producing X-ray spectra, while the SE mode provides high-resolution surface imaging with excellent contrast control. In addition to imaging, HITACHI H-7100 can be used for beam-induced deposition and lithography processes, such as nano-lithography, lift-off techniques, e-beam curing of photoresists, and sub-micron beam writing. H-7100 also offers an automatic sample-staining feature that allows for selective staining of samples with metal salts or other compounds, improving sample visibility and contrast. HITACHI H-7100's powerful flash functions enable image capturing and storage of up to 100 frames per second, allowing for quick and easy analysis of SEM images. It also includes built-in software for parameter optimization, data acquisition, and analysis. H-7100 is easy to operate, maintain, and calibrate for both low and high vacuum operation, allowing for excellent and consistent results across a wide range of applications. Its ergonomic design makes it easy to move and re-aim the electron beam, providing excellent image and editing capabilities. Overall, HITACHI H-7100 is a highly advanced and accurate scanning electron microscope, packed with features that make it one of the best SEMs available today. Its sophisticated imaging and analysis capabilities, combined with excellent sample preparation, make it well suited for industry and research applications.
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