Used HITACHI H-7600 #9096278 for sale

HITACHI H-7600 is a high resolution scanning electron microscope (SEM) designed for imaging, chemical composition analysis and precision material analysis. It features a stand-alone scanning electron equipment and multiple analytical modules. This laboratory instrument offers the highest standard of analytical performance, reliability, and user-friendly features to facilitate its operation. The powerful H-7600 scanning electron microscope features a cutting-edge energy-dispersive X-ray spectrometer (EDS) module, a focused ion-beam column, and a B-mode (micron-level) resolution. This machanical/electrical system offers unsurpassed imaging and highly accurate analysis capabilities for a wide range of materials. The imaging unit of HITACHI H-7600 has a proprietary MAXG detector design and a Gemini Column lens which allows for a wide range of imaging configurations. Its imaging machine offers both high-end performance and versatility. H-7600's bright-field and backscatter detectors also offer high resolution images of materials as thin as 1 µm. A nano-capable slot has been added to the tool to allow for low-voltage imaging of nano-objects. HITACHI H-7600's EDS asset provides a wide range of elemental analysis capabilities. It is equipped with an energy-dispersive X-ray spectrometer which features an analytical range of up to 10 keV, a lithium-drifted silicon detector, and a Peltier-cooled vacuum chamber. H-7600 also features an EDS analysis model with a wide range of detection limits and resolutions, providing compatibility with a variety of samples and applications. HITACHI H-7600 also features a focused ion-beam column which is equipped with a high-resolution CCD detector. This column is designed to provide an accurate image of material cross-sections at the nanometer scale. It is also used to create high-resolution images of line-edge profiles or nano-fabrication patterns. H-7600 Scanning Electron Microscope is an invaluable tool for materials researchers and other scientific and industrial applications. Its advanced analytical and imaging capabilities have made it an industry-leading instrument for a wide range of applications, such as failure analysis and semiconductor characterization.