Used HITACHI H-7650 #9362179 for sale

HITACHI H-7650 is a scanning electron microscope (SEM). It is designed for imaging samples of various materials, including metals, glasses, ceramics, polymers and semiconductors in the fields of material science, medical research, and semiconductor analysis. H-7650 has a gun type electron source. The equipment is highly stable, with resolution down to 0.5nm allowing for the observation of nanoscale structures. It has a unique ProBeam beam control module that allows for optimized scan size and resolution, making sample observation fast and efficient. HITACHI H-7650 has a high sensitivity of over one million times, which allows it to analyze the surface charge of samples with lower concentrations of particles. The system allows for a range of observation modes, such as bright field, dark field, and fluorescence imaging. It also has functions that can quickly identify foreign particles, making it suitable for QA days. H-7650 has a wide range of imaging accessories, such as digital cameras, sample chamber attachments, and X-ray detectors. These accessories are designed to provide superior imaging capabilities, allowing for greater insight into complicated samples. It also has advanced vacuum and emission control systems to minimize charging and other image distortions. HITACHI H-7650 is equipped with a high-accuracy joystick and rotational function, enabling easy sample manipulation. The unit can be easily interfaced with a variety of other instruments, such as analytical scanning transmission electron microscopes (STEM). Combined with the SEM/STEM, H-7650 is capable of conducting a wide range of analyses, such as elemental mapping, inhibitor-assisted compositional analysis and chemical phase mapping. HITACHI H-7650 is also designed with a user-friendly interface and automated scripts, making operation easier for personnel of all skill levels. Additionally, the machine can be controlled remotely via its Ethernet port, allowing users to access the controls from any desktop computer. In conclusion, H-7650 is a highly versatile and reliable instrument for observing samples with nanoscale resolution. With its excellent sensitivity and range of imaging accessories, it is an ideal choice for use in material science, medical research, and semiconductor analysis.