Used HITACHI HD-2000 #293810355 for sale

HITACHI HD-2000
ID: 293810355
Scanning Transmission Electron Microscope (STEM).
HITACHI HD-2000 is a scanning electron microscope (SEM) featuring a wide range of applications. It has the ability to detect even the smallest of features on an object's surface with unprecedented accuracy and resolution. HITACHI HD 2000 utilizes an integrated high-deflection electron gun to generate signals of impressive sensitivity and resolution. These signals are then directed through a comprehensive optical system comprised of lenses and deflectors that accurately detect the slight variations in surface topography. HD-2000 is equipped with a dead stop feature, a unique control system that prevents over-scanning, ensuring accuracy and accuracy of data while protecting the samples from harm. It also features an advanced digital interface that allows users to effortlessly adjust working parameters such as magnification, energy, depth, etc. The upgraded power supply and detector assembly of HD 2000 enable reliable and error-free operation. The standard digital imaging modes on HITACHI HD-2000 include bright field and dark field imaging, as well as the ability to generate false color images. It also has the capabilities to capture a variety of different magnifications, including up to 204,800x. Moreover, a set of automated features and enhanced image processing tools helps to improve the quality of the data. In addition to the impressive capabilities, HITACHI HD 2000 also offers a robust and reliable structure. Its robust aluminum and magnesium-based structure is able to effectively reduce mechanical disturbances and vibration, ensuring reliability and stability of analysis. Its exterior protective frame and cabinet, equipped with relevant shielding, offers users with a safe and secure environment for work. At the core of HD-2000 is an ultra-high density low-light digital camera and a built-in dedicated software application. This ensures fast and accurate scan digital photography, allowing detailed observation of the specimen surface with a variety of parameters. Installed with an adjustable focus detector, this instrument further allows users to observe accurate measurements of the specimen. With its user-friendly interface and practical qualifications, users can easily and quickly obtain topnotch quality images of their specimens for further analysis.
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