Used HITACHI HD-2300 #293830390 for sale

HITACHI HD-2300 is a scanning electron microscope (SEM) capable of providing high-resolution imaging and analytical capabilities for a wide range of samples. It has a wide range of features, including multiple imaging modes, a tiltable specimen stage, an EDX detector, and the ability to measure secondary and backscattered electron signals. The primary imaging mode of HITACHI HD 2300 is the Scanning Electron Beam (SEB) mode. This mode is capable of providing high-resolution images of samples at magnifications ranging from 5x to 1,000,000x. The SEB mode is also capable of obtaining secondary electron images as well as backscattered electron images. HD-2300 also includes a motorized X-Y specimen tilt stage. This stage allows for samples to be tilted up to 360 degrees in order to better acquire imaging data in situ. This tiltable stage also provides the capability of automating Stage Angle SEM (SA-SEM) imaging. Another major feature of HD 2300 is the Energy Dispersive X-ray spectrometer (EDX). This spectrometer provides qualitative and quantitative elemental analysis of samples in the microscope to depths of up to more than 10 microns. It is capable of measuring more than 68 elements from Be to U. HITACHI HD-2300 also includes the capability to measure secondary electron signals (SE) as well as backscattered electron signals (BSE). These signals provide imaging capabilities that can identify particular structures and types of materials. The Secondary Electron Detector (SED) and Backscattered Electron Detector (BED) both provide additional information on the composition of the specimen and its structures. In summary, HITACHI HD 2300 is a powerful scanning electron microscope that provides imaging and analytical capabilities. It includes the SEB imaging mode, motorized X-Y specimen tilt stage, EDX spectrometer, and the ability to measure both SE and BSE signals. All these features combined make HD-2300 a powerful tool for sample characterization.