Used HITACHI HD-2300 #9281980 for sale

ID: 9281980
Wafer Size: 12"
Vintage: 2006
Scanning Transmission Electron Microscope (STEM), 12" 2006 vintage.
HITACHI HD-2300 is a comprehensive scanning electron microscope (SEM) designed to meet the requirements of advanced applications in materials analysis and process control. It offers high resolution imaging, high resolution elemental analysis, precise sample movements with low coefficient of thermal expansion, and a new high-speed analytical equipment for fast imaging and compositional analysis. HITACHI HD 2300 is equipped with a high performance field emission electron gun (FEG) with a high voltage power supply and an advanced high vacuum (HV) system. The FEG offers improved imaging performance due to its higher spatial resolution and ability to image thinner specimens. The HV unit supports high-vacuum operation up to 1.3 × 10-3 Pa, with a stable detection sensitivity. Moreover, HD-2300 features additional components such as a programmable sample stage for adjustable height and tilt, a low-background detector, and a real-time particle monitor. For imaging, HD 2300 offers low contrast imaging (LCI) and secondary electron imaging (SEI). LCI has sensitivity to small particle differences; this means it can image samples with significant differences in particle composition, as well as conduct detailing of the lateral distribution of elements. Additionally, SEI is a useful imaging tool for non-conductive samples and offers excellent image quality. HITACHI HD-2300 incorporates a unique automated analysis machine, which enables quick and accurate compositional analysis of the samples. This tool is equipped with elemental X-ray analysis, including secondary electron energy spectroscopy (ISS), pulse avalanche counter scanning (PACS) X-ray mapping, and an automated particle size measurement asset. HITACHI HD 2300 can analyze the selective distribution of elements in the two-dimensional plane as well as the three-dimensional arrangement. To facilitate precise sample movements, HD-2300 also offers a high precision fine stage. This stage is equipped with a sample stage shifter for large-range movements. The shifter offers a high coefficient of thermal expansion, making it ideal for samples that require repeated scanning. HD 2300 also includes a high-precision measuring model that enables accurate positioning of the specimen. HITACHI HD-2300 combines advanced features, durable components, and an intuitive user interface. Thanks to these aspects, it is a powerful and reliable tool for extracting information from a variety of samples. Additionally, through its enhanced image processing capabilities, it provides convenient image data management and precise analysis.
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