Used HITACHI I6300 #9236029 for sale

HITACHI I6300 scanning electron microscope (SEM) is a high-performance equipment designed to provide precise imaging and analytical capabilities for a wide range of applications. The microscope utilizes a high-resolution e-beam to produce a 3D image of the sample surface, with resolutions for imaging as low as 1 nm. HITACHI I 6300 has a comprehensive range of analytical features, such as secondary electron imaging (SEI), backscattered electron imaging (BSEI), X-ray elemental mapping (EDX), energy dispersive X-ray spectroscopy (EDS), and wavelength dispersive X-ray spectroscopy (WDS). The microscope also features a dual beam system, which allows both SEM and variable pressure scanning electron microscope imaging (VPSEM) to take place simultaneously. I-6300 has an Advanced Beam Technology (ABT) unit, which enables it to outperform other SEMs in terms of stability and resolution. The ABT machine composites scan speeds and number of frames to optimize signal-to-noise ratios. The ABT tool also improves the signal-to-time ratio, allowing faster data acquisition. The microscope uses a new type of high-resolution low-noise detector, which improves sensitivity and contrast. The detector is made of a fine mesh over a compact readout asset, allowing for high-resolution imaging. The microscope also has an advanced built-in X-ray source, allowing for accurate and repeatable X-Ray mapping and EDX analysis within a single model. The specimen chamber of HITACHI I-6300 is designed to provide optimal operating conditions. It features a special environment that can handle a wide range of samples, such as vacuum and low-pressure operation, as well as large sample holders. The vacuum level is adjustable with a special control valve and automated gas management equipment. I6300 can be used for a wide variety of imaging applications, including biological specimens, materials science, semiconductor wafer analysis, and nanostructure characterization. With its high-resolution imaging capabilities, the microscope can produce detailed images on various sample surfaces. It is also equipped with special automated imaging modes, making it suitable for various automated tasks, such as routine monitoring or defect detection.