Used HITACHI / KOKUSAI VR-120SD #9293902 for sale

HITACHI / KOKUSAI VR-120SD
ID: 9293902
Wafer Size: 12"
Resistivity measurement system, 12".
HITACHI KOKUSAI VR-120SD is a mask and wafer inspection equipment which is used for advanced defect examination and inspection systems in the semiconductor industry. With this system, target materials such as masks and wafers are examined for defects at the microscopic level, enabling users to rapidly identify, localize and rectify problems in the manufacturing process. The unit boasts an exceptional level of accuracy in defect detection and analysis, due to its advanced optics and image processing capabilities. It features two high resolution cameras, each with its own dedicated light source, enabling it to capture crisp images of even the most minute defects on masks or wafers. The advanced camera systems also permit faster inspection times, while its large imaging area ensures scan accuracy. In addition to its comprehensive image analysis capabilities, this machine also offers a wide range of optional accessories, including reticles, adaptors, objectives, stages and buffer modules. These accessories can be customized to meet the specific needs of the user, making it suitable for a variety of inspection applications. The user interface of the tool is also intuitive and user-friendly. It is a Windows-based asset with a graphical user interface, allowing the user to easily view and modify the settings and parameters of the model. It also allows the user to save and retrieve preset projects and make further adjustments if needed. Finally, VR-120SD serves as a highly effective element in the overall semiconductor processes. It is a reliable and reliable tool for effective inspection and defect analysis. It can help ensure higher quality and yield in the manufacturing process, as well as higher overall cost efficiency.
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