Used HITACHI NB5000 #293779250 for sale
URL successfully copied!
Tap to zoom
ID: 293779250
Vintage: 2018
Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
Resolution:
SEM: 1.0 nm at 15 kV
FIB: 5 nm at 40 kV
FIB Column:
Ga Ion source: >50 nA
2-Stage electro static lens system
Octopole electro static lens system
Pattern generator system: 4K x 4K
SEM Column:
Maximum beam current: >30 nA
3-Stage electro magnetic lens reduction system
Electro static blanking system
SE Power supply
Image memory: 2560 x 1920
Vacuum system:
Turbo molecular pump
Dry pump
Ion source chamber
Electron gun
(2) Buffer tanks
Micro-sampling system:
3-Axis motor drive system
X Range: 1 mm
Y Range: 2 mm
Z Range: 2.5 mm
Chamber scope:
LCD Monitor, 7"
Stand
IR Camera
Power cable
AC / DC Adaptor
Air compressor
N2 Gas leak system
Multi-stage control panel
Console control unit
Power supply unit
AC Power distribution
Transformer
Laser sample height adjust tool
Manual sample height adjust tool
Interlock function
PC
Processor: INTEL i7
Flat panel LCD Monitor, 22"
Mouse
Keyboard
Control panel
RAM: 16 GB
64-Bit
Hard Disk Drive (HDD): 500 GB
Does not include EDS
Operating system: Windows 7
2018 vintage.
Title: Introduction to HITACHI NB5000 Scanning Electron Microscope NB5000 is a cutting-edge scanning electron microscope (SEM) known for its high-resolution imaging capabilities, user-friendly interface, and versatility across various scientific and industrial applications. This advanced instrument represents the pinnacle of imaging technology in the realm of electron microscopy, offering researchers and professionals the ability to delve into the intricate details of nanoscale structures with unparalleled clarity and precision. Key Features and Specifications: At the heart of HITACHI NB5000 is its electron optical system, which enables the microscope to achieve ultra-high resolution imaging with impressive magnification capabilities. The instrument is equipped with a field emission gun (FEG) as the electron source, allowing for the generation of a highly focused electron beam essential for imaging samples at the nanometer scale. NB5000 boasts a maximum accelerating voltage of up to 30 kV, enabling users to observe even the smallest details and surface features of a wide range of specimens. The microscope features a variety of detectors, including secondary electron (SE), backscattered electron (BSE), and energy-dispersive X-ray spectroscopy (EDS) detectors, offering users multiple imaging and analysis options to suit their research needs. The SE detector is commonly used for high-resolution surface imaging, while the BSE detector provides information on sample composition and topography. The integration of EDS capabilities allows for elemental analysis of specimens, making HITACHI NB5000 a versatile tool for both imaging and chemical characterization. NB5000 is equipped with advanced beam control systems, such as beam deceleration mode and automated beam adjustment functions, ensuring optimal imaging conditions and repeatability for users. The microscope also features a motorized stage with high precision positioning capabilities, making it easy to navigate and analyze specific regions of interest within a sample. Additionally, HITACHI NB5000 comes with an intuitive user interface and software package that facilitates seamless operation and data analysis, simplifying the workflow for researchers and technicians. Applications and Impact: NB5000 finds extensive use in a wide range of scientific fields, including materials science, life sciences, geology, and electronics, among others. In materials science, the microscope is employed for examining the microstructure and morphology of various materials, aiding in the characterization of defects, grain boundaries, and phase identification. In the life sciences, HITACHI NB5000 enables researchers to explore biological samples at the cellular and subcellular levels, unraveling the intricate structures of proteins, cells, and tissues with exceptional clarity. In the field of geology, NB5000 is utilized for studying mineral compositions, pore structures, and sedimentary features, providing valuable insights into Earth's geological processes and history. In the electronics industry, the microscope plays a crucial role in failure analysis, process optimization, and quality control of semiconductor devices and microelectronics components. The high-resolution imaging and analytical capabilities of HITACHI NB5000 have revolutionized research and development efforts in these diverse fields, paving the way for new discoveries and innovations. In conclusion, NB5000 scanning electron microscope stands as a pinnacle of imaging technology, offering researchers and professionals an unparalleled tool for exploring the nanoscale world with precision and clarity. With its advanced features, high-resolution imaging capabilities, and versatile applications, HITACHI NB5000 empowers users to push the boundaries of scientific discovery and innovation across various disciplines, making it an indispensable asset in the realm of electron microscopy.
There are no reviews yet