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Marketplace
Scanning Electron Microscopes
HITACHI
NX 2000
#293798458
Used HITACHI NX 2000 #293798458 for sale
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Scanning Electron Microscopes
Manufacturer
HITACHI
Model
NX 2000
Equipment Details
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ID:
293798458
Focused Ion Beam Scanning Electron Microscope (FIB-SEM).
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