Used HITACHI / REGULUS 8100 #9353290 for sale

HITACHI / REGULUS 8100 is a scanning electron microscope (SEM) that offers a wide range of features for specimen analysis. The microscope is equipped with a unique design to offer superior image quality and high precision imaging. Its advanced features include high resolution imaging, high level of detail for concept imaging and a large depth of field to allow users to understand and study the structure of specimens in great detail. HITACHI 8100 is capable of imaging a wide range of sample sizes and shapes with its advanced infrared (IR) and ultraviolet (UV) radiation detectors. Its high-speed electrostatic deflection and focus alignment system are also capable of achieving higher resolutions in both transparent and opaque materials. Its HEPA filter includes an optically pure vacuum chamber to prevent unwanted pollutant particles from affecting the sample. The detector system employed by REGULUS 8100 features high-sensitivity based on a backscattered electron (BSE) detector that provides crisp and clear images. The SEM detection presents a high-resolution imaging capability that can be used to observe structural features of the specimen. Additionally, an electron backscatter diffraction (EBSD) detector provides qualitative elemental analysis. The microscope's vacuum operation environment ensures that high-resolution, crystalline, and sensitive imaging is attained. This operation environment provides a high level of imaging quality and is paired with an oblique specimen holder to reduce electron beam changes due to the angular motion of the sample. 8100 features SE Imaging (SEI) with three different objectives for various sample sizes. SEI incorporates electron beam scanning to offer a beam size that has been optimized for imaging purposes. The beam scan helps reduce TEM distortions caused by the sample geometry and surface topography. HITACHI / REGULUS 8100 offers an optional feature for alignment and gripping of non-transparent samples with using an integrated, mechanical drive. The user can adjust the drive for sample gripping and positioning while performing imaging tasks. An integrated software system allows users to program steps for automated specimen operations and measurements, making the microscope ideal for repeat studies. To provide enhanced specimen imaging, the microscope also offers electron beam patterning capabilities. This feature enables users to define precise etch patterns in order to prepare samples for imaging purposes. Furthermore, the microscope can also be used in conjunction with the optional SEM software suite for performance reliable measurements and recording of processing parameters. HITACHI 8100 is a cutting-edge scanning electron microscope that offers ease of use, reliable and accurate performance, and superior quality imaging capabilities. Its advanced features, including high-resolution imaging, high level of detail for concept imaging, high-sensitivity backscattered electron detector, SE imaging, and electron beam patterning, make it an ideal choice for applications such as materials science research and device engineering.