Used HITACHI RS-3000T #9268841 for sale

HITACHI RS-3000T
ID: 9268841
Wafer Size: 8"
Review Scanning Electron Microscope (SEM), 8".
HITACHI RS-3000T is a scanning electron microscope of the highest precision and research quality, developed by HITACHI High-Technologies Corporation of Japan. This advanced flight component-inspection tool is available in a wide array of sizes and resolutions to meet the needs of research and industrial applications. With its built-in high-sensitivity video control unit, HITACHI RS 3000T also provides highly accurate digital analysis of minute features, as well as detailed images of large objects. RS 3000 T utilizes electron optics, digital image-processing, and a software platform to provide a range of technologies designed to capture and analyze 3D images of objects in the nanometer range, down to a single atom. This scanning electron microscope is equipped with a resolution of up to 16nm, which ensures the most precise measurements and detailed visualization of sample objects. This tool is capable of producing surface topographical images of objects based on the signals it detects from the emitted electrons. The beam current of HITACHI RS 3000 T is variable and allows for the optimization of the energy distribution according to the type of sample. By adjusting this feature, the equipment is also able to capture images in contrast mode. This contrast mode uses high contrast images to unveil surface details and conduct high-magnification imaging. The analytical capabilities of RS 3000T increase its utility in an array of applications. Its beam-detector and signal-processing electronics enable it to identify the most minute atomic features and reveal the exact measurements and properties of each atomic particle. This performance of RS-3000T makes it a perfect tool for nanotechnology research, biological research, and environmental analysis. The intuitive software employed by HITACHI RS-3000T allows operators to efficiently store and organize each image in separate folders and access them for later comparison and analysis. This user-friendly software component of the microscope also assists researchers in calculating the proper parameters of their objects, as well as providing detailed data on the position of each individual atomic particle. The standard analytical components of HITACHI RS 3000T include an Energy Dispersive X-ray (EDX) detector, a x400 secondary electron detector, a x500 backscatter detector, and a x500 Dynamic Secondary detector. Together, these detectors can capture a spectroscopy spectrum of the surface chemistry of the sample, conduct image simulations, and identify crystal lattice structures and external defects. RS 3000 T Scanning Electron Microscope offers a wide range of advanced capabilities for a wide variety of research and industrial applications, as well as providing detailed information and images on the nanometer scale. From surface topographical analysis to the research of atom-level features, this cutting-edge technology enables researchers the discovery and analysis of minute particles and objects.
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