Used HITACHI RS-4000 #9036353 for sale
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ID: 9036353
Scanning electron microscope (SEM), 8"-12"
Includes:
Process evaluation: Litho, etch, CMP
Beam tilt: 10°
Laser darkfield microscope, EDX 15 kV
SEM:
Ip = <10pA ... 200pA
Darkfield OM:
Laser scatterlight (B/W)
Field of view (ca.): 620 um (220x)
Illumination level: Manually adjustable
For particles >1 um strong interference patterns appear
CCD Bad pixel calibration possible: No
Brightfield OM:
Field of view (ca.): 620 um (220x)
B/W only
Cassette interface:
(2) 12" Load-ports
8" Load ports: No
Robot handler (single end effector)
Status lamp (R/Y/G/B)
GEM/SECs
Sub-Fab (supporting) equipment:
Equipment rack (power box)
(2) BOC EDWARDS EPX-180LE Dry pumps
(1) Cryo tiger cryo compressor
EDX (Option), 15 kV:
Automatic defect re-detection
Automatic defect classification
Vacc: 500 V - 5 kV (auto.), resp. 15 kV (man.)
SEM Pixels: 512 or 1024
SEM Magnification minimum: 1000x (140 µm FOV)
SEM Magnification maximum: 200000x (0,7 µm FOV)
Detector SEM:
Left topography (BSE)
Right topography (BSE)
SE
VC
Image display SEM: Live and average mode
OM: DF + BF
OM Magnification:
220x (ca. 620µm)
440x (by digital zoom)
Tilt: 10° (beam tilt)
Stage rotation: No
Stage accuracy: +/- 1µm
Image resolution SEM: 3.0 nm (800 eV)
Auto EDX: Yes
Defect sensitivity
MTBF: 1000 Hrs
Downtime per month: 6 Hrs
Particle contamination
Front side: Maximum 7 adders >0.16µm
Back side:
Maximum: 3500 adders > 0.2µm
Maximum: 100 adders > 5.0 µm (incl. clusters)
Throughput:
10 Wafer / h (50 Defects)
900 Defects+ADC/h (1wafer)
Manual loading without defect file: Yes
FIB Vacc: No FIB
Milling accuracy
Milling frame size
Measurement requirements:
AST in current software: No
Lowest SEM magnification: 1000x
Maximum voltage for automatic ADR and EDS 5kV
15kV for manual EDS
Minimum voltage 500V
Image mixing: Ok
Manual loading without defect file: Ok
NORAN System: (6) EDS will be offered
Stage resolution: Ok
Beam tilt: 10°
Image resolution at 800eV: 3.0nm
230 VAC (6kVA), Single phase, 50 Hz
CE Marked
Currently stored in clean room
2005 vintage.
HITACHI RS-4000 is a scanning electron microscope (SEM) that uses a focused electron beam to create images for visualizing and analyzing a variety of materials. It employs advanced energy filtering technology for an optimal contrast of specimen's topographic and chemical composition. In addition, it uses Scanning Beam Energy Dispersive X-ray (SBEDX) to measure the elemental composition of the sample. The microscope features a multi-spectral imaging mode which has the ability to acquire four different images at the same time in different wavelengths, enabling the full visualisation of physical, chemical, and structural properties of a sample. HITACHI RS 4000 offers ultra-high resolution imaging with its wide range of objective lens magnifications - up to 500x. The integrated auto-stigmation functions allow for easy adjustment of the electron beam while eliminating the need for manual adjustments. It also has a built-in remote control equipment, allowing for remote monitoring and operation of the system. In addition to high resolution imaging, RS-4000 offers a wide range of analytical capabilities. It can be used to measure surface topography, layer thicknesses, and 3D sample parameters over large areas. It also has the ability to characterize specimen coatings, such as films, glasses and metals, using X-ray fluorescence, energy-dispersive X-ray spectroscopy (EDS), and electron backscatter diffraction (EBSD). RS 4000 is versatile enough to be used in a range of applications, including material characterization, metallurgical research, microelectronics, medical research, and forensic investigation. It has several advanced features, including detectors for high-resolution secondary electron (SE) imaging, quasi-backscatter (QB) imaging, and an ultra-high-resolution, large-field-of-view backscattered electron (BE) detector, which enable the acquisition of both topographic and chemical information in a single scan. HITACHI RS-4000 is designed for ease of use, and its open architecture allows for quick integration into automated processes. The unit is user-friendly, with intuitive software for setting up experiments, controlling the running of scans, and reviewing data. Additionally, the machine offers a wide variety of support services, from maintenance and training to software development. The user-friendly design and advanced features make HITACHI RS 4000 an ideal choice for laboratories and research centers that require SEM capabilities with reliability and flexibility.
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