Used HITACHI RS-4000 #9180760 for sale

HITACHI RS-4000 Scanning Electron Microscope (SEM) is a powerful and versatile analytical instrument designed for advanced scientific analysis, materials research, and failure analysis. Its unique capabilities enable it to observe and image objects at incredibly high magnification with superior resolution and depth of field. With its large three-axis SEM chamber and 150mm x 100mm active area, HITACHI RS 4000 offers a high level of flexibility for a variety of imaging needs. The microscope's physical characteristics (including its depth of field and resolution) can be adjusted quickly and easily with the various control parameters available. It has a built-in liquid nitrogen cooling system that ensures subzero temperature stability, making it ideal for analyzing highly sensitive samples. In addition, the analysis chamber can be cooled with liquid helium or nitrogen for additional temperature stability. RS-4000 has an adjustable pressure control that allows you to take images over a wide range of pressures. The high-powered secondary electron detector allows for faster acquisition of images with lower noise levels and higher image quality. The detector has variable aperture settings and can also be used to take elemental and visual spectrographic data from the sample. The automated interface also makes operation more efficient by controlling automated image collection and data acquisition. RS 4000 includes HITACHI ERS Analytical software system for scanning, capture, and post-processing of images and data. The software has both an advanced version and a light version that is intended for simple routine analysis. It also has a wide range of analytical capabilities such as X-ray microanalysis, SEM-EDS mapping, and Scanning Transmission Electron Microscopy (STEM). HITACHI RS-4000 is a state-of-the-art research instrument that is designed for advanced users who need a reliable and repeatable imaging and analysis platform. It is an excellent choice for materials research, microscopic analysis, failure analysis, and other advanced scientific applications.