Used HITACHI RS-4000 #9315755 for sale
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ID: 9315755
Wafer Size: 12"
Vintage: 2007
Scanning Electron Microscope (SEM), 12"
2007 vintage.
HITACHI RS-4000 is a scanning electron microscope (SEM) that is part of the company's latest range of advanced measuring equipment. It is ideal for research and material analysis, offering strong performance and precise results for a wide range of applications. HITACHI RS 4000 offers a number of features and functions to provide high-end scanning functions. It uses a comprehensive observation method, which is facilitated by a complete, optimal imaging equipment that is based on four-quadrant point deflectors. This helps to achieve greater optical resolution, while a channel-cut channeltron detector helps to prevent secondary electron image distortion. RS-4000 is designed to operate at low secondary electron emission and is supported by an FE-SEM coating system. This unit assists in reducing electron scattering, providing an image with higher contrast and resolution. Other features of this model include a high-resolution variable pressure secondary electron detector (VP-SEM), which helps to maintain a stable and consistent performance over a wide range of low-pressure imaging conditions. In addition, RS 4000 uses a unique calibrated coating mode to create a thin film which improves the level of contrast and resolution. This calibrated film can be used on specimens of up to 200mm in size and helps to improve the amount of information that can be captured. This scanning electron microscope can also be used for at-depth imaging to create even more detailed images. For operation and analysis, this model comes with a range of built-in features, such as an integrated image processing machine and microwaves for greater measurement accuracy. For improved accuracy, a multi-zone imaging tool can be used which automatically calibrates sample surface topography and helps to stabilize imaging surface characteristics. Overall, HITACHI RS-4000 is an advanced scanning electron microscope designed for research and measurement applications. It provides superior imaging capabilities and powerful features, making it an ideal choice for high-end SEM applications.
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